National Institute of Standards and Technology, Boulder Laboratories (NIST Boulder)
Aberration-Corrected Transmission Electron Microscope (TEM)
equipmentanalytical / metrologyIndustry: Aerospace
- Category
- Physical Infrastructure
- Affiliations
- NIST Boulder
Description
JEOL ARM-200F probe-corrected 200 kV analytical electron microscope resolving single atoms, with EELS/EDS chemical analysis and MAADF/HAADF STEM detectors; used for GaN polarity and nanowire interface studies in the Precision Imaging Facility.
Official page
Open official page (opens in a new tab)Contact
- Contact
- Alexana Roshko <alexana.roshko@nist.gov> (303) 497-5420; Ann Chiaramonti Debay <chiaramonti@nist.gov> (303) 497-5701; Ryan White <ryan.white@nist.gov> (303) 497-3938
Details
- Keywords
- stem imaging, eels, gan polarity, nanowire leds, nanometrology
- Location
- Boulder, Colorado
- Key spec
- 200 kV; <0.1 nm STEM resolution; JEOL ARM-200F
- Equipment class
- Probe-corrected analytical electron microscope (TEM/STEM)
- Associated entity
- NIST Headquarters ; Laboratory Programs ; Physical Measurement Laboratory ; Applied Physics Division ; Quantitative Nanostructure Characterization Group